Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Atomic and electronic structure study of a Co2FeAl0.5Si0.5half-metal thin film on Si(111)

High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate.

Nanobeam Diffraction and Geometric Phase Analysis for Strain Measurements in Si/SiGe Nanosheet Structures

Strain at Coalescence of Patterned (Al)GaN Nanorod Arrays Formed by Selective Area Growth for Optoelectronic Devices

Application of STEM EELS Quantification Relative Compositional Ratio Mapping to Characterize SiCOH - Ultra Low-k Dielectric Materials in Si-based Devices

Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

Structure-Properties Relations in III-Nitride Nanostructures for Optoelectronics

Advancement of Heteroepitaxial III-V/Si Thin Films through Defect Characterization

Characterization of Defects in III-V Semiconductor Materials (InP, GaAs and InGaAs/ InP on Si) in Nano-sized Patterns by Transmission Electron Microscopy

Imaging Graphene by Field Ion Microscopy

(S)TEM Characterization of Chemically Exfoliated Black Phosphorus

Thin Films of SnSe2Grown by Molecular Beam Epitaxy on GaAs (111)B Substrates

Observation of a Quasi-ordered Structure in Monolayer WxMo(1-x)S2Alloys

Mapping Periodic Lattice Distortions in Exfoliated Dichalchogenides with Atomic Resolution cryo-STEM

Nanoscale Mapping of Interfacial Electrical Transport in Graphene-MoS2Heterostructures with STEM-EBIC

Correlative and Multiplexed Microscopy for 2-D Chalcogenide Semiconductors

Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

In-situ dislocation imaging during deformation in high entropy alloys

Nano-scale characterization of L10-ordered FePt granular films for heat-assisted magnetic recording devices

Modification of Grain Boundary and Interfacial Structure in Al2O3Coatings

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract