Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Combining Simulation, Experiment, and Data Science for Materials Characterization and Design

Abstract

Denoising of Atomic-Scale Images Based on Automatic Grain Segmentation, Unsupervised Primitive Unit Cell Extraction and Periodic Block-Matching

Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping

Theory and Parameter Free Calculations of EELS and X-ray Spectra

Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy

Multimodal Acquisition of Properties and Structure with Transmission Electron Reciprocal-space (MAPSTER) Microscopy

Quantitative Imaging of Probability Current Flow in Real and Momentum Space

Big, deep, and smart data from atomically resolved images: exploring the origins of materials functionality

Deep Data Mining in a Real Space: Application to Scanning Probe Microscopy Studies on a “Parent” State of a High Temperature Superconductor

Automated Data Acquisition and Indexing of Electron Channeling Patterns using the Dictionary Approach

EELS Mapping with Random Scan

Alloying in Flexible Transition-metal Chalcogenide Nanowires

Multidisciplinary Approach to Nanostructure Determination

Determination of Core/Double-Shell Architecture of a Single Tetragonal Bipyramidal Nanophosphor for Intense Dual-Mode Luminescence

Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy

Atomic-Resolution Composition Mapping in EDS STEM

Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks

New Insights into Deformation of Metallic Glasses by Combining Mesoscale Simulation and Fluctuation Electron Microscopy

BIM-Sim: Interactive Simulation of Broadband Imaging Using Mie Theory

The Power of Electron Diffraction Phase Analysis and Pattern Simulations Using the ICDD®Powder Diffraction File™ (PDF-4+)

Single-Slice Nanoworlds Online

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Combining Simulation, Experiment, and Data Science for Materials Characterization and Design

Abstract