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Theory and Parameter Free Calculations of EELS and X-ray Spectra

Published online by Cambridge University Press:  25 July 2016

J.J. Rehr ,
J. J. Kas  and
K. Jorissen
J.J. Rehr
Affiliation:
Department of Physics, University of Washington, Seattle, WA, USA
J. J. Kas
Affiliation:
Department of Physics, University of Washington, Seattle, WA, USA
K. Jorissen
Affiliation:
Amazon Web Services, Seattle, WA, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1408 - 1409
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Joshua, J., Kas, , et al, in X-Ray Absorption and X-Ray Emission Spectroscopy: Theory and Applications (ed. C. Lamberti & J. Van Bokhoven, (John Wiley & Sons, Ltd, Chichester, UK).Google Scholar
[2] Rehr, J. J., et al, Comptes Rendus Physique 10 (2009). p. 548.CrossRefGoogle Scholar
[3] Jorissen, K., et al, Phys. Rev. B 81, 155108 (2010).Google Scholar
[4] Vinson, J., et al, Phys. Rev. B 83 (2011). p. 115106.CrossRefGoogle Scholar
[5] Zhou, J., et al, J. Chem. Phys. 143, 184109 (2015).Google Scholar
[6] Kas, J., et al, Phys. Rev. B 90 (2014). p. 085112.Google Scholar
[7] Story, S., et al, UW Preprint 2016.Google Scholar
[8] The authors acknowledge funding from US DOE Grant DE-FG03-97ER45623. Dr. S. Story is thanked for discussions concerning the Corvus workflow tool.Google Scholar