Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-28T14:18:01.007Z Has data issue: false hasContentIssue false
  • English
  • Français

Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Mark P. Oxley ,
Myron D. Kapetanakis ,
Wu Zhou ,
Juan-Carlos Idrobo  and
Sokrates T. Pantelides
Mark P. Oxley
Affiliation:
Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA
Myron D. Kapetanakis
Affiliation:
Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA
Wu Zhou
Affiliation:
Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Juan-Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sokrates T. Pantelides
Affiliation:
Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1410 - 1411
Copyright
© Microscopy Society of America 2016 

References

[1] Krivanek, , et al., Nature 462, 7228 (2010).Google Scholar
[2] Zhou, , et al., Microscopy and Microanalysis 18, 1342 (2012).Google Scholar
[3] Kapetanakis, , et al., Phys. Rev. B 92, 125147 (2015).CrossRefGoogle Scholar
[4] Kapetanakis, , et al., under review.Google Scholar
[5] This research was supported by DOE Grant No. DE-FG02-09ER46554 (MDK, STP), by the U.S. Department of Energy Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division (MPO, WZ), the Center for Nanophase Materials Sciences (CNMS), which is sponsored at ORNL by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE (JCI). Numerical calculations were performed at the National Energy Research Scientific Computing Center (NERSC), which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar