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EELS Mapping with Random Scan

Published online by Cambridge University Press:  25 July 2016

Shixin Wang  and
Du Li

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1422 - 1423
Copyright
© Microscopy Society of America 2016 

References

Reference:

[1] Nellist, P. D. Scanning Transmission Electron Microscopy - Imaging and Analysis (eds. by S. J. Pennycook & P. D. Nellist, (Springer, NY) p. 91.Google Scholar