Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Nuclear and Irradiated Materials

Abstract

Microstructural Evolution of High-Strain-Rate Severe Plastic Deformation Processed 316L during Kr Ion Irradiation and elevated Temperature Exposures

Defects Generation and Surface Evolution of ZnO Nanobelts/Nanowires Under High-energy Electron Beam Irradiation

Electron Beam-Irradiation-Induced Annealing of Nanoscale Defects Created by Heavy Ion Beam Bombardment of Indium Phosphide

Fission Product Distribution in Irradiated TRISO Fuel

Irradiation Induced Defects in YBa2Cu3O7-δCoated Conductors

Electron probe microanalysis of a high burnup (Th,Pu)O2fuel section

Multi-scale Characterization of Oxidized Zirconium Alloys

Anomalous Beam Effects during in situ Transmission Electron Microscopy Deformation of Nanocrystalline and Ultrafine-grained Metals

Grain Boundary Precipitation in Ni Based Superalloy 690 Investigated via Site-specific Atom Probe Microscopy

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Quantification of Atomic Arrangements at Heterostructure Interfaces

Growth andIn SituCharacterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision

Observing Misfit Dislocation Interactions Across Thin Film Oxide Heterostructures

Characterization of a ferroelectric BaTiO3/SrTiO3heterostructure with interface-induced polarization

Stability Studies of MAPbI3: Identification of Degradation Pathways and Strategies for Observing the Native Structure of Lead Halide Perovskites

Structural Properties of (Sn,Mn)Se2- a New 2D Magnetic Semiconductor with Potential for Spintronic Applications

Crystallization Kinetics of the Phase Change Material GeSb6Te Measured with Dynamic Transmission Electron Microscopy

High Resolution STEM Study of Dy-doped Bi2Te3Thin Films

Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS

Combining STEM Imaging and EELS Mapping to Understand the Growth of La2CoMnO6Double Perovskites on (111) Oriented Perovskite Substrates

Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3Superlattices

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Nuclear and Irradiated Materials

Abstract

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract