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Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3Superlattices

Published online by Cambridge University Press:  25 July 2016

Steven R. Spurgeon
Affiliation:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington, USA
Despoina M. Kepaptsoglou
Affiliation:
SuperSTEM, SciTech Daresbury Campus, Daresbury, UK
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Ryan B. Comes
Affiliation:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington, USA
Quentin M. Ramasse
Affiliation:
SuperSTEM, SciTech Daresbury Campus, Daresbury, UK
Phuong-Vu Ong
Affiliation:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington, USA
Peter V. Sushko
Affiliation:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington, USA
Scott A. Chambers
Affiliation:
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, Washington, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Jones, L., et al, “Smart Align - a new tool for robust non-rigid registration of scanning microscope data”. Advanced Structural & Chemical Imaging 1, 8 (2015).Google Scholar
[2] Spurgeon, S. R., et al, “olarization screening-induced magnetic phase gradients at complex oxide interfaces.”. Nat. Commun 6, 111, 2015.Google Scholar
[3] Comes, R.B., et al, “Interface-induced Polarization in SrTiO3-LaCrO3 Superlattices.”. Adv. Mater. Int (In press 2016.Google Scholar