Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Steel Corrosion Mechanisms during Pipeline Operation:In SituCharacterization

Twin-assisted growth mechanism of heterogeneous interfaces between gold nanoparticles and nominally stable substrates

Nanocharacterization of Strontium Titanate Thin Films and Oxide-Electrode Interfaces in Resistive Switching Devices

Investigation of N-Polar AlGaN/GaN and InAlN/GaN Thin Films Grown by MBE

Local Strain Relaxation by A-type Dislocation Clusters in InxGal-xN/GaN Film with Indium Compositions of x = 0.07 and 0.12

Temperature Dependence of the Silicon Nitride Volume Plasmon

Microstructural characteristics of GaN/AlN thin films grown on a Si (110) substrate by molecular beam epitaxy: Transmission electron microscopy study

Bismuth Particle Formation in Annealed Dilute GaAsi-x-yPyBixAlloys

Interfacial electrical conductivity controlled crystallization of amorphous LaAlO3under electron-beam irradiation

High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated byIn SituTEM and X-ray Diffraction

Dislocation Analysis of Thermal-Cycle-Annealed Mesa-Structured HgCdTe/HgTe/CdTe/ZnTe/Si (211)

Characterizing InGaAs/GaAs quantum dots using low-kV FESEM imaging and EDS analysis at the nanometer scale

In situAtomic-Scale Visualization of CuO Nanowire Growth

3D Reconstruction and Separation of Nickel and Zirconia Based Phases from Solid Oxide Fuel Cell Anode Using Backscatter Electron Imaging

Annular Bright Field STEM Investigation of the (0001) Stacking Fault in Alumina

The Effects of Seeding Strategies on Morphology of Electroless Deposited Pd Thin Film

Size Effect on Spontaneous Flux-closure Domains in BiFeO3Thin Films

Characterizing Epitaxial Growth of Nd2Ir2O7Pyrochlore Thin Films via HAADF-STEM Imaging and EDX

TEM studies of TiO2-based passivated contacts in c-Si solar cells

S/TEM Investigation of the Structure of (Bi,Sb)2Te3/h-BN Heterostructures Grown by Molecular Beam Epitaxy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract