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Nanocharacterization of Strontium Titanate Thin Films and Oxide-Electrode Interfaces in Resistive Switching Devices

Published online by Cambridge University Press:  25 July 2016

William J. Bowman
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Eva Sediva
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Peter Crozier
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University
Jennifer L.M. Rupp
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Messerschmitt, F., Kubicek, M., Schweiger, S. & Rupp, J.L.M. Adv. Func. Mat 24 (2014) 7448.CrossRefGoogle Scholar
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[4] We acknowledge ScopeM at ETH Zürich, and thank the staff for their support. This work wassupported by the Swiss NSF (project 155986). W.J.B. was a Swiss Government Excellence Scholarshipholder for the academic year 2015-2016 (ESKAS 2015.1183); and acknowledges financial support ofthe US NSF Graduate Research Fellowship Program (DGE-1311230).Google Scholar