Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T12:27:48.475Z Has data issue: false hasContentIssue false
  • English
  • Français

Interfacial electrical conductivity controlled crystallization of amorphous LaAlO3under electron-beam irradiation

Published online by Cambridge University Press:  25 July 2016

G. Y. Lee ,
J. Y. Kim ,
S. Y. Moon ,
S. H. Baek ,
D. H. Kim  and
H. J. Chang
G. Y. Lee
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea Center for Noncrystalline Materials, Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea
J. Y. Kim
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea Research Institute of Advanced Materials, Seoul National University, Seoul, South Korea
S. Y. Moon
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea
S. H. Baek
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea
D. H. Kim
Affiliation:
Center for Noncrystalline Materials, Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea
H. J. Chang
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1580 - 1581
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rijnders, G. & Blank., D. H. A. Nature 433 (2005). p. 369.CrossRefGoogle Scholar
[2] Reyren, N., Thiel, S., Caviglia, A. D., Kourkoutis, L. F., Hammerl, G., Richter, C., Schneider, C. W., Kopp, T., Ruetschi, A. S., Jaccard, D., Gabay, M., Muller, D. A., Triscone, M. J. & Mannhart, J. Science 317 (2007). p. 1196.Google Scholar
[3] Wang, X., Lu, W. M., Annadi, A., Liu, Q. Z., Gopinadhan, K., Dhar, S. & Venkatesan, T. Ariando, Physical Review B 84 (2011). p. 075312.Google Scholar
[4] Ohtomo, A. & Hwang., H. Y. Nature 427 (2004). p. 423.Google Scholar
[5] Sambri, A., et al., Phys. Lett. 100 (2012). p. 231605.Google Scholar