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Temperature Dependence of the Silicon Nitride Volume Plasmon

Published online by Cambridge University Press:  25 July 2016

Brian Zutter ,
Matthew Mecklenburg  and
B. C. Regan
Brian Zutter
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
B. C. Regan
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1574 - 1575
Copyright
© Microscopy Society of America 2016 

References

References:

[1] White, E. R., et al, Applied Physics Express 4 (2011). p. 055201.Google Scholar
[2] Mecklenburg, M, et al, Science 347 (2015). p. 629–632.Google Scholar
[3] Seah, M P & Smith, G C Journal of Materials Science 21 (1986). p. 1305–1309.CrossRefGoogle Scholar
[4] Meyer, G Zeitschrift fur Physik 148 (1957). p. 61–71.Google Scholar
[5] This work was supported in part by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA. Data presented were acquired at the Center for Electron Microscopy and Microanalysis at the University of Southern California.Google Scholar