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TEM studies of TiO2-based passivated contacts in c-Si solar cells

Published online by Cambridge University Press:  25 July 2016

Haider Ali ,
Xinbo Yang ,
Kristopher O. Davis ,
Klaus Weber  and
Winston V. Schoenfeld
Haider Ali
Affiliation:
Department of Materials Science and Engineering, University of Central Florida, Orlando, FL, USA Florida Solar Energy Center, University of Central Florida, Cocoa, FL, USA c-Si Division, U.S. Photovoltaic Manufacturing Consortium, Orlando, FL, USA
Xinbo Yang
Affiliation:
Research School of Engineering, The Australian National University, Canberra, Australia
Kristopher O. Davis
Affiliation:
Florida Solar Energy Center, University of Central Florida, Cocoa, FL, USA c-Si Division, U.S. Photovoltaic Manufacturing Consortium, Orlando, FL, USA
Klaus Weber
Affiliation:
Research School of Engineering, The Australian National University, Canberra, Australia
Winston V. Schoenfeld
Affiliation:
Department of Materials Science and Engineering, University of Central Florida, Orlando, FL, USA Florida Solar Energy Center, University of Central Florida, Cocoa, FL, USA c-Si Division, U.S. Photovoltaic Manufacturing Consortium, Orlando, FL, USA CREOL, the College of Optics & Photonics, University of Central Florida, Orlando, FL, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1600 - 1601
Copyright
© Microscopy Society of America 2016 

References

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