Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract

Influence of Laser-Pulse Energy on Field Evaporation of LaAlO3in Atom Probe Tomography Analysis

Fast identification of dislocations in semiconductor materials by electron channeling contrast imaging using a scanning electron microscope

Direct Observation of Conducting Path with Highly Reduced Graphene Oxide in Au/GO/Al Resistive Switching Memory

Crystallite Size Evaluation of ZnO Nanoparticles via Transmission Electron Microscopy and X-ray Powder Diffraction

Atomic Arrangement of Contamination on Graphene

Refined Phase Imaging by Electron Diffractive Imaging

Atomic Structure of Self-Pillared, Single-Unit-Cell Sn-MFI Zeolite Nanosheets

The Influence of Beam Convergence Angle on Channeling Effect during STEM/EDS Quantification of SiGe Concentration

The Growth of Catalyst-free NiO Nanowires

Utilization of Scanning Electron Microscopy to Optimize Electroless Deposition of Pd Thin Film on Porous Stainless Steel

Advanced TEM characterization of new electrical contacts for high efficiency c-Si solar cells

Atomic-scale characterization of the oxygen vacancy ordering in La0.5Sr0.5CoO3thin film grown on SrTiO3using in-situ cooling experiments

Dewetting Transitions of Au/Ni Bilayer Films

Cadmium Sulfide (CdS) preparation by High-Energy Ball Milling

Morphological Modulation of Acoustic Phonons Imaged with Ultrafast Electron Microscopy

Observation of MEL stacking faults in two-dimensional MFI zeolite nanosheets

Thickness Analysis of TiO2Thin Films on Quartz by Optical Spectroscopy

Low-dose Microscopy and Beam Damage Study of Infiltrated Zeolite Y

Study on Chemical Vapor Deposition Growth and Transmission electron Microscopy MoS2/h-BN Heterostructure

Aloof Beam Plasmons in Silver Nanoparticles

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Physical Science Symposia

Microscopy for Thin Films of Metals, Semiconductors and Insulators

Abstract