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Advanced TEM characterization of new electrical contacts for high efficiency c-Si solar cells

Published online by Cambridge University Press:  25 July 2016

Q. Jeangros
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
J. Geissbühler
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland PV center, Swiss Center for Electronics and Microtechnology, Neuchâtel, Switzerland
J. Bullock
Affiliation:
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA Research School of Engineering, The Australian National University, Canberra, Australia
A. Javey
Affiliation:
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, USA
S. De Wolf
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
A. Hessler-Wyser
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
C. Ballif
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland PV center, Swiss Center for Electronics and Microtechnology, Neuchâtel, Switzerland

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Geissbühler, J, Werner, J, Nicolas, S.M.D, et al., Applied Physics Letters 104 (2015). p. 081601.CrossRefGoogle Scholar
[2] Geissbühler, J, De Wolf, S., Faes, A., et al., IEEE Journal of Photovoltaics 4 (2014). p. 1055.CrossRefGoogle Scholar
[3] Bullock, J, Hettick, M, Geissbühler, J, et al., Nature Energy 15031 (2016).Google Scholar
[4] Bullock, J, Zheng, P., Jeangros, Q., et al., Submitted (2016).Google Scholar
[5] Support is gratefully acknowledged from the Swiss National Science Foundation (project CRSII2_154474, “Impact of composition and nanometer scale DISorder in transparent Conductive Oxides: a new route to design materials with enhanced transport properties (DisCO)”), and the Department of Energy under the FPaceII project.Google Scholar