Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T20:04:51.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Dislocation Analysis of Thermal-Cycle-Annealed Mesa-Structured HgCdTe/HgTe/CdTe/ZnTe/Si (211)

Published online by Cambridge University Press:  25 July 2016

M. Vaghayenegar ,
S. Simingalam ,
Y. P. Chen  and
D. J. Smith
M. Vaghayenegar
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287
S. Simingalam
Affiliation:
Army Research Laboratory, 2800 Power Mill Rd, Adelphi, MD 20783
Y. P. Chen
Affiliation:
Army Research Laboratory, 2800 Power Mill Rd, Adelphi, MD 20783
D. J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1584 - 1585
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rogalski, A. Infrared. Phys. Techn 43 (2002) 187–210.CrossRefGoogle Scholar
[2] Rogalski, A. Infrared. Phys. Techn 50 (2007) 240–252.Google Scholar
[3] Jacobs, R. N., et al., J. Electron. Mater. 42 (2013) 3148–3155.Google Scholar
[4] Stoltz, A. J., et al., J. Electron. Mater. 40 (2011) 1785–1789.CrossRefGoogle Scholar
5] This work was supported by Army Research Office Grant #63749-EL. We gratefully acknowledge the use of facilities within the John M. Cowley Center for HREM at Arizona State University.Google Scholar