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High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated byIn SituTEM and X-ray Diffraction

Published online by Cambridge University Press:  25 July 2016

Q. Jeangros ,
M. Duchamp ,
E. Rucavado ,
F. Landucci ,
C. Spori ,
R.E. Dunin-Borkowski ,
C. Hébert ,
M. Morales-Masis ,
C. Ballif  and
A. Hessler-Wyser
Q. Jeangros
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
M. Duchamp
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Jülich Research Centre, Jülich, Germany
E. Rucavado
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
F. Landucci
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland Interdisciplinary Centre for Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
C. Spori
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Jülich Research Centre, Jülich, Germany
C. Hébert
Affiliation:
Interdisciplinary Centre for Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
M. Morales-Masis
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
C. Ballif
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
A. Hessler-Wyser
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1582 - 1583
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Morales-Masis, M, et al., Advanced Functional Materials 26 (2016). p. 384.Google Scholar
[2] Voyles, PM & Muller, DA Ultramicroscopy 93 (2002). p. 147.Google Scholar
[3] Feldmann, F, et al., Applied Physics Letters 104 (2014). p. 181105.Google Scholar
[4] Support is gratefully acknowledged from the Swiss National Science Foundation (project CRSII2_154474, “Impact of composition and nanometer scale DISorder in transparent Conductive Oxides: a new route to design materials with enhanced transport properties (DisCO)”). The authors wish to thank Dr. O. Sereda, Dr. I. Marozau and J. Tillier for access to an in situ X-ray diffractometer.Google Scholar