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Growth andIn SituCharacterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1504 - 1505
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- © Microscopy Society of America 2016
References
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[7] The research is sponsored by the Division of Materials Sciences and Engineering, Office of BasicEnergy Sciences, U.S. Department of Energy. BGS and MF-C were supported by the Center forNanophase Materials Sciences which is sponsored at Oak Ridge National Laboratory by the Office ofScience, Basic Energy Sciences, U.S. Department of Energy. Calculations made use of resources at theOak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under Contract DE-AC05-00OR22725.Google Scholar
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