Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-03T08:38:02.054Z Has data issue: false hasContentIssue false
  • English
  • Français

Crystallization Kinetics of the Phase Change Material GeSb6Te Measured with Dynamic Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

M. M. Winseck ,
H.-Y. Cheng ,
G. H. Campbell  and
M. K. Santala
M. M. Winseck
Affiliation:
Department of Mechanical, Industrial, and Manufacturing Engineering, Oregon State University, Corvallis, OR, USA
H.-Y. Cheng
Affiliation:
IBM/Macronix PCRAM Joint Project, Macronix International Co., Ltd., Hsinchu, Taiwan
G. H. Campbell
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, 94550, USA
M. K. Santala
Affiliation:
Department of Mechanical, Industrial, and Manufacturing Engineering, Oregon State University, Corvallis, OR, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1514 - 1515
Copyright
© Microscopy Society of America 2016 

References

[1] Wuttig, M. & Yamada, N. Nature Materials 6 (2007). p. 824.CrossRefGoogle Scholar
[2] Cheng, H.-Y., Raoux, S. & Jordan-Sweet, L.J. Journal of Applied Physics 115 (2014). p. 5.Google Scholar
[3] This work performed, in part, under the auspices of the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.Google Scholar