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Correlative and Multiplexed Microscopy for 2-D Chalcogenide Semiconductors

Published online by Cambridge University Press:  25 July 2016

Jeffrey D. Cain ,
Eve D. Hanson  and
Vinayak P. Dravid
Jeffrey D. Cain
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA
Eve D. Hanson
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA
Vinayak P. Dravid
Affiliation:
Department of Materials Science and Engineering, and the NUANCE Center, Northwestern University, Evanston, IllinoisUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1554 - 1555
Copyright
© Microscopy Society of America 2016 

References

References:

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[5] This work is partly supported by NSF-DMR and AFOSR programs.Google Scholar