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Nanoscale Mapping of Interfacial Electrical Transport in Graphene-MoS2Heterostructures with STEM-EBIC

Published online by Cambridge University Press:  25 July 2016

Edward R. White ,
Alexander Kerelsky ,
William A. Hubbard ,
Rohan Dhall ,
Stephen B. Cronin ,
Matthew Mecklenburg  and
B. C. Regan
Edward R. White
Affiliation:
Department of Chemistry, Imperial College London, London SW7 2AZ, UK. Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California, 90095, USA.
Alexander Kerelsky
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California, 90095, USA.
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California, 90095, USA.
Rohan Dhall
Affiliation:
Department of Electrical Engineering, University of Southern California, Los Angeles, California, 90089, USA.
Stephen B. Cronin
Affiliation:
Department of Electrical Engineering, University of Southern California, Los Angeles, California, 90089, USA.
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, California, 90089, USA.
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California, 90095, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1552 - 1553
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Geim, A & Grigorieva, I Nature 499 (2013). p. 419.Google Scholar
[2] White, E, et al., Microscopy and Microanalysis 20(S3 (2014). p. 172.Google Scholar
[3] Britnell, L, et al., Science 340 (2013). p. 1311.Google Scholar
[4] White, E, et al., Applied Physics Letters 107 (2015). p. 223104.Google Scholar
[5] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, and by National Science Foundation Award No. DMR-1206849. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA, and the Zeiss center in Peabody, MA.Google Scholar