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High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate.

Published online by Cambridge University Press:  25 July 2016

Alexander V. Kvit ,
Jie Feng ,
Chenyu Zhang ,
Dane Morgan  and
Paul M. Voyles
Alexander V. Kvit
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Jie Feng
Affiliation:
Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA
Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA
Dane Morgan
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA Materials Science Program, University of Wisconsin-Madison, Madison, WI, 53706, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1526 - 1527
Copyright
© Microscopy Society of America 2016 

References

[1] Renshaw Wang, X., etal., Science 349(Issue 6249 (2015) 716.CrossRefGoogle Scholar
[2] Yankovich, A. B., et al., Nat. Commun. 5 (2014) 4155.CrossRefGoogle Scholar
[3] This work was supported by the US Department of Energy, Basic Energy Sciences, Grant DE-FG02-08ER46547.Google Scholar