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Mapping Periodic Lattice Distortions in Exfoliated Dichalchogenides with Atomic Resolution cryo-STEM

Published online by Cambridge University Press:  25 July 2016

Robert Hovden ,
Adam W. Tsen ,
Pengzi Liu ,
Benjamin H. Savitzky ,
Yu Liu ,
Wenjian Lu ,
Yuping Sun ,
Philip Kim ,
Abhay N. Pasupathy  and
Lena F. Kourkoutis
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Adam W. Tsen
Affiliation:
Department of Chemistry, University of Waterloo, Waterloo, ON N2L 3G1, Canada
Pengzi Liu
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Benjamin H. Savitzky
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Yu Liu
Affiliation:
Key Laboratory of Materials Physics, Chinese Academy of Sciences, Hefei 230031, China
Wenjian Lu
Affiliation:
Key Laboratory of Materials Physics, Chinese Academy of Sciences, Hefei 230031, China
Yuping Sun
Affiliation:
Key Laboratory of Materials Physics, Chinese Academy of Sciences, Hefei 230031, China High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China Centre of Advanced Microstructures, Nanjing University, Nanjing 210093, China
Philip Kim
Affiliation:
Department of Physics, Harvard University, Cambridge, Massachusetts 02138, USA
Abhay N. Pasupathy
Affiliation:
Department of Physics, Columbia University, New York, New York 10027, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1550 - 1551
Copyright
© Microscopy Society of America 2016 

References

[1] Wilson, J. A., Di Salvo, F. J. & Mahajan, S. Advances in Physics 24, 117–201, 1975.CrossRefGoogle Scholar
[2] Tsen, A. W., Hovden, R., Wang, D. Z., Kim, Y. D., Okamoto, J., Spoth, K. A., Liu, Y., Lu, W. J., Sun, Y. P., Hone, J., Kourkoutis, L. F., Kim, P. & Pasupathy, A. N. Proc. Natl. Acad. Sci. U.S.A 112, 15054–15059, 2015.CrossRefGoogle Scholar
[3] Thompson, A. H., Gamble, R. F. & Revelli, J. F. Solid State Communications 9, 981–985, 1971.CrossRefGoogle Scholar
[4] Ishiguro, T. & Sato, H. Phys. Rev. B 44, 2046–2060, 1991.CrossRefGoogle Scholar
[5] The work at Cornell is supported by the Packard Foundation and made use of the Cornell Center for Materials Research Shared Facilities supported through the NSF MRSEC program (DMR-1120296).Google Scholar