Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

FIB Milling strategies for TEM Sample Preparation of Spheroidal Powder Particles

The Path to Quantitative 3D Metrology: FIB-SEM 3D Tomography in Data Storage Industry

High-Accuracy Sample Preparation for Three Dimensional Atom Probe Tomography Using Orthogonal Column Layout FIB-SEM and its STEM function

Vacuum-Assisted Ex situ Lift Out for Plan View FIB Specimen Preparation

Development of Automated Micro-Sampling System and Application to Semiconductor Devices

Development of Electron Optics System for "ETHOS" High-Performance FIB-SEM

A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites

A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples

A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage

A Unique Approach for Preparing Cross-Sectional EM Study of Textile Fibers

The NanoWorkstation: Complementing FIB-SEM Tools with Micromanipulators

Characterization of the CIGS Solar Cell System in the FIB-SEM Laboratory

NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples

Technical Refinement of the Orage Ga-FIB column and Optimizing its Control for Routine Analytical Tasks

Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices

Coloring with Focused Ion Beam Fabricated Nanostructures

Investigation of slice thickness for FIB tomography in a plasma focused ion beam system

Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Pushing the Limits of Cryo-EM

Abstract

Advanced Data Acquisition From Electron Microscopes With SerialEM

Microscopy and Microanalysis

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Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

Pushing the Limits of Cryo-EM

Abstract