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A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples

Published online by Cambridge University Press:  01 August 2018

J. Lindsay ,
C. Parmenter  and
J. Goulden
J. Lindsay
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, UK
C. Parmenter
Affiliation:
Nanoscale and Microscale Research Centre, University Park Campus, University of Nottingham, UK
J. Goulden
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 840 - 841
Copyright
© Microscopy Society of America 2018 

References

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[3] Alexander Rigort, , et al, PNAS 109(12 2012) p. 4449.Google Scholar
[4] Stefano Rubino, , et al, Journal of Visualized Experiments 89 2014.Google Scholar