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FIB Milling strategies for TEM Sample Preparation of Spheroidal Powder Particles

Published online by Cambridge University Press:  01 August 2018

Alexis Ernst ,
Mei Wei  and
Mark Aindow
Alexis Ernst
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT06269, USA
Mei Wei
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT06269, USA
Mark Aindow
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT06269, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 826 - 827
Copyright
© Microscopy Society of America 2018 

References

[1] Gianuzzi, LA in Introduction to Focused Ion Beams (ed. LA Gianuzzi Springer USA pp. 213.Google Scholar
[2] Unocic, KA, Mills, MJ Daehn, GS J. Micros. 240 2010) pp. 227–238.Google Scholar
[3] This work was supported in part by a research grant from Thermo Fisher Scientific under a Thermo Fisher Scientific - UConn partnership agreement. The studies were performed in the UConn /Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA)..Google Scholar