Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Jian-Guo Zheng

doi:10.1017/S1431927618004798

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Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Published online by Cambridge University Press: 01 August 2018

Jian-Guo Zheng

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Jian-Guo Zheng*: Affiliation:
Irvine Materials Research Institute, University of California, Irvine, CA 92697-2800

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Information: Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 860 - 861

DOI: https://doi.org/10.1017/S1431927618004798 [Opens in a new window]
Copyright: © Microscopy Society of America 2018

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Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

Volume 24, Supplement S1
Jian-Guo Zheng ^(a1)
DOI: https://doi.org/10.1017/S1431927618004798

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Preparation of Sharp Tip Samples Using a Tescan GAIA3 FIB-SEM System

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