Analytical and Instrumentation Science Symposia
Solid-state X-ray Spectrometry at 50 Years
Abstract
Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES
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- 01 August 2018, pp. 746-747
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Comparison and Combination of Energy and Wavelength Dispersive X-Ray Spectrometry in Electron Probe Microanalysis of Minerals and Glasses
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- 01 August 2018, pp. 748-749
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Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses
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- 01 August 2018, pp. 750-751
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An Open Evaluation of Hyperspectral Unmixing Strategies for EDS Analysis
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- 01 August 2018, pp. 752-753
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Advances in SDD-based EDS and Comparisons to WDS for Light Element Sensitivity
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- 01 August 2018, pp. 754-755
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SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios
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- 01 August 2018, pp. 756-757
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Measurement of Elemental Composition of FeNi and SiGe Thin Films by Electron Probe Microanalysis with Stratagem Software
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- 01 August 2018, pp. 758-759
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Microstructure Characterization of Microalloyed 5xxx Aluminum Alloys with Er and Zr using Analytical Transmission Electron Microscopy and Synchrotron X-ray Fluorescence Microscopy
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- 01 August 2018, pp. 760-761
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Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem
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- 01 August 2018, pp. 762-763
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Composition and Thickness Mapping Using STEM EDS
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- 01 August 2018, pp. 764-765
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Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer
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- 01 August 2018, pp. 766-767
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Dynamically Templated Acquisition of EDS X-ray Spectral Images Using Electron Image Contrast
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- 01 August 2018, pp. 768-769
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Comparing Quantitative Results of Zeta Factor Method using Various Values of Ionization Cross-sections
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- 01 August 2018, pp. 770-771
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Systematic Error Determination of ζ-factor Quantification in XEDS Analysis
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 772-773
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New Approaches to Determine K Line Ratios of Pure Elements
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- 01 August 2018, pp. 774-775
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Soft Matter X-ray Microanalysis in the Analytical Electron Microscope
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 776-777
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Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-ray Microanalysis
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- 01 August 2018, pp. 778-779
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Quantitative Compositional Stage Mapping and Cluster Analysis
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 780-781
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Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach
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- 01 August 2018, pp. 782-783
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A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis
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- 01 August 2018, pp. 784-785
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