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New Approaches to Determine K Line Ratios of Pure Elements

Published online by Cambridge University Press:  01 August 2018

Ralf Terborg ,
Falk Reinhardt ,
Fabian Nitsche  and
Timo Wolff
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany
Falk Reinhardt
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany
Fabian Nitsche
Affiliation:
Bruker AXS GmbH, Östliche Rheinbrückenstraße 49, 76187Karlsruhe, Germany
Timo Wolff
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 774 - 775
Copyright
© Microscopy Society of America 2018 

References

[1] Scofield, J.H. Phys. Rev. A 9 1974) p. 1041.Google Scholar
[2] Salem, S. I., Panossian, S. L. Krause, R. A. Atom. Data Nucl. Data 14 1974 91.Google Scholar
[3] Ertuğral, B., Apaydin, G., Ҫevik, U., Ertuğrul, M. Kobya, A. Radiat. Phys.Chem 76 2007 15.Google Scholar
[4] Elam, W. T., Ravel, B. D. Sieber, J. R. Radiat. Phys.Chem 63 2002 121.Google Scholar
[5] Möser, B. Cryst. Res. Technol 20 1985) p. 1503.Google Scholar