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Vacuum-Assisted Ex situ Lift Out for Plan View FIB Specimen Preparation
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 832 - 833
- Copyright
- © Microscopy Society of America 2018
References
[2] Anderson, R
Klepeis, S.J. in Introduction to Focused Ion Beams (eds. F.A. Stevie and L.A. (Giannuzzi
Springer
NY
p. 173.Google Scholar
[4] Kamino, T., et al
in Introduction to Focused Ion Beams (eds. F.A. Stevie and L.A. (Giannuzzi
Springer
NY
p. 229.Google Scholar
[8] Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525.Google Scholar
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