Microscopy and Microanalysis: Volume 24 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Quantitative Magnetic Characterization in the TEM

Abstract

Cryogenic TEM Studies of Bloch and Neel Skyrmion Textures in Lacunar Spinels and Cubic Helimagnets

Characterizing Dzyaloshinskii Domain Walls in Asymmetric [Pt/Co/Ni/Ir]N Multi-Layers using Lorentz TEM

Visualized Effects of Oxidation and Temperature on Vortex-State Fe3O4 Particles Examined by Environmental TEM and Off-Axis Electron Holography

Study of Vortex State in Permalloy Plates Using Optimized Electron Holography

Revealing the Magnetic Interactions of DP in Cu-Co alloys by Electron Holography

Direct Laser Deposition and Homogenization of Ni-Co-Mn-Sn Magnetocaloric Material

Microstructural Development in Melt-spun Nd2Fe14B Under High Magnetic Field Annealing

Strain Analysis from Nano- to Micro-length Scales

Abstract

Strain Mapping Using EBSD Cross Correlation and Raman Methods

High Angular Resolution Electron Backscatter Diffraction Studies of Tetragonality in Fe-C Martensitic Steels

Local Strain Analysis using Scanning Nanobeam Electron Diffraction during In Situ TEM Nanomechanical Testing

Developing High Resolution and High Precision Strain Mapping Methodologies for Materials Research and Semiconductor Technology

Residual Stress Characterization on the Mesoscale in Additive Manufacturing

Nano-scale Elastic Strain Maps of Twins in Magnesium Alloys

Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy

Strain Characterization of Advanced CMOS Transistors: An Industry Perspective

Dynamical Effects on the Geometric Phase

Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy

Strain Analysis in Polycrystalline Diamond under Extreme Conditions

Coherency and Thermal Evolution of Metastable and Stable P Phase Precipitates in Aluminum Alloy AA5456

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract

The Munich Compact Light Source: Biomedical Research At a Laboratory-Scale Inverse-Compton Synchrotron X-ray Source

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 24 - August 2018

Analytical and Instrumentation Science Symposia

Quantitative Magnetic Characterization in the TEM

Abstract

Strain Analysis from Nano- to Micro-length Scales

Abstract

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract