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Volume 17 - Supplement S2 - July 2011

Contents

Page 16 of 49

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

  • X-ray Microanalysis Artifacts Visualized

  • V Dusevich, J Melander, J Eick
  • Published online by Cambridge University Press:
    09 April 2017, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

  • C Schwandt
  • Published online by Cambridge University Press:
    08 April 2017, pp. 608-609
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High Current Electron-probe Microanalysis of Ni and Co in Olivine in the NWA 773 Lunar Meteorite Clan

  • K Gibson, B Jolliff, P Carpenter
  • Published online by Cambridge University Press:
    08 April 2017, pp. 610-611
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software

  • H Demers, N Poirier-Demers, N de Jonge, D Drouin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 612-613
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Instrumental Performance Parameters for Specification and Check of Energy Dispersive X-Ray Spectrometers as in the International Standard ISO 15632

  • V-D Hodoroaba
  • Published online by Cambridge University Press:
    08 April 2017, pp. 614-615
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Industrial Applications of Electron Probe Microanalysis (EPMA)

  • S Goresh
  • Published online by Cambridge University Press:
    08 April 2017, pp. 616-617
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Environmental NanoBiology: Structural Evaluation Of Naturally Occurring Transition Metal Oxide-Containing Surface Films From Freshwaters

  • R Smith, E Sánchez
  • Published online by Cambridge University Press:
    08 April 2017, pp. 618-619
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Windowless Silicon Drift Detectors

  • R Anderhalt, A Sandborg
  • Published online by Cambridge University Press:
    08 April 2017, pp. 620-621
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advances In Microscopy and Microanalysis in the Field of Forensic Firearm Examination and Identification

  • D Lamagna
  • Published online by Cambridge University Press:
    08 April 2017, pp. 622-623
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe

  • P McSwiggen, N Mori, M Takakura, C Nielsen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 624-625
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Focused Ion Beam

Abstract

  • Advanced FIB Sample Preparation for High Performance TEM Analysis

  • F Altmann, R Salzer, M Simon, S Huebner, C Grosse, A Graff
  • Published online by Cambridge University Press:
    08 April 2017, pp. 626-627
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

  • L Lechner, J Biskupek, U Kaiser
  • Published online by Cambridge University Press:
    08 April 2017, pp. 628-629
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

  • R Cerchiara, P Fischione, J Liu, J Matesa, A Robins
  • Published online by Cambridge University Press:
    08 April 2017, pp. 632-633
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Physical Failure Analysis Techniques Using 3D Rotation Imaging from Plane-View TEM Sample

  • H-J Kang, J-G Gwak, T-S Park, T-S Back, H-J Kim, O Han
  • Published online by Cambridge University Press:
    08 April 2017, pp. 634-635
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Focus Ion Beam for Cross-Sectional TEM Specimen Preparation of Nanomaterials

  • J-G Zheng, S Xie
  • Published online by Cambridge University Press:
    08 April 2017, pp. 636-637
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates

  • F Rivera, J Abbott, R Davis, R Vanfleet
  • Published online by Cambridge University Press:
    08 April 2017, pp. 638-639
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In Situ Probe Approaches for Charge Reduction, Sample Manipulation, and Modified Total Release Lift-out

  • K Langworthy, J Ditto, C Hartfield, D Krinsley
  • Published online by Cambridge University Press:
    08 April 2017, pp. 640-641
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 16 of 49