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Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

Published online by Cambridge University Press:  08 April 2017

R Cerchiara ,
P Fischione ,
J Liu ,
J Matesa  and
A Robins
R Cerchiara
Affiliation:
EA Fischione Instruments, Inc
P Fischione
Affiliation:
EA Fischione Instruments, Inc
J Liu
Affiliation:
EA Fischione Instruments, Inc
J Matesa
Affiliation:
EA Fischione Instruments, Inc
A Robins
Affiliation:
EA Fischione Instruments, Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 632 - 633
Copyright
Copyright © Microscopy Society of America 2011