Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-28T01:31:28.049Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe

Published online by Cambridge University Press:  08 April 2017

P McSwiggen ,
N Mori ,
M Takakura  and
C Nielsen
P McSwiggen
Affiliation:
McSwiggen & Associates
N Mori
Affiliation:
JEOL Ltd
M Takakura
Affiliation:
JEOL Ltd
C Nielsen
Affiliation:
JEOL USA, Inc

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 624 - 625
Copyright
Copyright © Microscopy Society of America 2011