Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 17 - Supplement S2 - July 2011

Contents

Page 15 of 49

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry
P Williams
Published online by Cambridge University Press:

08 April 2017, pp. 562-563
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Automated Classification of SIMS Images Using K-means Clustering
A Konicek, J Lefman, C Szakal
Published online by Cambridge University Press:

08 April 2017, pp. 564-565
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Trace Element Micro-Analytical Imaging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
A Netting, J Payne, B Wade, T Raimondo
Published online by Cambridge University Press:

09 April 2017, pp. 566-567
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa
E Scroggs, J Friel, A Davatzes
Published online by Cambridge University Press:

08 April 2017, pp. 568-569
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19
S Seddio, B Jolliff, R Korotev, P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 570-571
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM
J Lábár
Published online by Cambridge University Press:

09 April 2017, pp. 572-573
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Using Electron Backscatter Diffraction to Aid Identification of Fossilized Dinosaur Eggshells
P Trimby, G Grellet-Tinner
Published online by Cambridge University Press:

08 April 2017, pp. 574-575
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA
M Jercinovic, M Williams, J Allaz, J Donovan
Published online by Cambridge University Press:

08 April 2017, pp. 576-577
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Challenges in Electron Probe Micronalysis 60 Years after Castaing: Examples from Complex Uranium and Rare Earth Element Minerals from Northern Australian Ore Deposits
K Goemann
Published online by Cambridge University Press:

08 April 2017, pp. 578-579
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Improving EPMA Analyses Using Mean Atomic Number Backgrounds
D Wark, J Donovan
Published online by Cambridge University Press:

08 April 2017, pp. 580-581
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools
P Carpenter
Published online by Cambridge University Press:

08 April 2017, pp. 582-583
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Historical Development of the Cameca EPMA
D Snoeyenbos, M Outrequin
Published online by Cambridge University Press:

08 April 2017, pp. 584-585
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

50 Years of JEOL Electron Probe Micro Analyzer
H Takahashi
Published online by Cambridge University Press:

09 April 2017, pp. 586-587
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)
C Henderson
Published online by Cambridge University Press:

08 April 2017, pp. 588-589
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

On the Performance of XEDS and EELS in the AEM: 25 Years Later
H Fraser, D Klenov, Y-C Wang, H Cheng, N Zaluzec
Published online by Cambridge University Press:

08 April 2017, pp. 590-591
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials
D Meier, J Davis, A Konicek, E Vicenzi, S Wight
Published online by Cambridge University Press:

08 April 2017, pp. 592-593
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Multivariate Statistical Analysis of STEM-EDS at the Noise Floor
C Parish, P Edmondson, M Miller
Published online by Cambridge University Press:

08 April 2017, pp. 594-595
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

High Resolution Imaging and X-Ray Microanalysis in the FE-SEM
R Gauvin, N Brodusch, P Michaud, L Rodrigue, M Trudeau
Published online by Cambridge University Press:

08 April 2017, pp. 596-597
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
D Klenov, B Freitag, H von Harrach, A D'Alfonso, L Allen
Published online by Cambridge University Press:

08 April 2017, pp. 598-599
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM
V-D Hodoroaba, T Salge, R Terborg, V Rackwitz
Published online by Cambridge University Press:

08 April 2017, pp. 600-601
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 15 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract

Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry

Automated Classification of SIMS Images Using K-means Clustering

Trace Element Micro-Analytical Imaging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)

Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa

Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19

Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM

Using Electron Backscatter Diffraction to Aid Identification of Fossilized Dinosaur Eggshells

Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA

Challenges in Electron Probe Micronalysis 60 Years after Castaing: Examples from Complex Uranium and Rare Earth Element Minerals from Northern Australian Ore Deposits

Improving EPMA Analyses Using Mean Atomic Number Backgrounds

Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools

Historical Development of the Cameca EPMA

50 Years of JEOL Electron Probe Micro Analyzer

Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)

On the Performance of XEDS and EELS in the AEM: 25 Years Later

X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

Multivariate Statistical Analysis of STEM-EDS at the Noise Floor

High Resolution Imaging and X-Ray Microanalysis in the FE-SEM

Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing

Abstract