Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-28T00:46:59.285Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM

Published online by Cambridge University Press:  09 April 2017

J Lábár
J Lábár*
Affiliation:
Research Institute for Technical Physics and Materials Science (MTA MFA)

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 572 - 573
Copyright
Copyright © Microscopy Society of America 2011