Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T01:27:16.703Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Imaging and X-Ray Microanalysis in the FE-SEM

Published online by Cambridge University Press:  08 April 2017

R Gauvin ,
N Brodusch ,
P Michaud ,
L Rodrigue  and
M Trudeau
R Gauvin
Affiliation:
McGill University
N Brodusch
Affiliation:
McGill University
P Michaud
Affiliation:
McGill University
L Rodrigue
Affiliation:
Hydro-Québec Research Institute
M Trudeau
Affiliation:
Hydro-Québec Research Institute

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 596 - 597
Copyright
Copyright © Microscopy Society of America 2011