Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

D Klenov; B Freitag; H von Harrach; A D'Alfonso; L Allen

doi:10.1017/S1431927611003862

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Allen, Leslie J. D’Alfonso, Adrian J. Freitag, Bert and Klenov, Dmitri O. 2012. Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy. MRS Bulletin, Vol. 37, Issue. 1, p. 47.

Herzing, A.A. and Anderson, I.M. 2013. Robust elemental mapping of nanostructures at ultrahigh resolution using event-streamed spectrum imaging in an aberration-corrected analytical electron microscope. Ultramicroscopy, Vol. 127, Issue. , p. 85.

Parish, Chad M. and Miller, Michael K. 2014. Aberration-Corrected X-Ray Spectrum Imaging and Fresnel Contrast to Differentiate Nanoclusters and Cavities in Helium-Irradiated Alloy 14YWT. Microscopy and Microanalysis, Vol. 20, Issue. 2, p. 613.

Parish, Chad M. White, Ryan M. LeBeau, James M. and Miller, Michael K. 2014. Response of nanostructured ferritic alloys to high-dose heavy ion irradiation. Journal of Nuclear Materials, Vol. 445, Issue. 1-3, p. 251.

Parish, Chad M. Field, Kevin G. Certain, Alicia G. and Wharry, Janelle P. 2015. Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys. Journal of Materials Research, Vol. 30, Issue. 9, p. 1275.

Parish, Chad M. and Miller, Michael K. 2015. A review of advantages of high-efficiency X-ray spectrum imaging for analysis of nanostructured ferritic alloys. Journal of Nuclear Materials, Vol. 462, Issue. , p. 433.

Allen, L.J. 2017. Simulation in elemental mapping using aberration-corrected electron microscopy. Ultramicroscopy, Vol. 180, Issue. , p. 142.

Parish, Chad M. Wang, Kun and Edmondson, Philip D. 2018. Viewpoint: Nanoscale chemistry and crystallography are both the obstacle and pathway to advanced radiation-tolerant materials. Scripta Materialia, Vol. 143, Issue. , p. 169.

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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

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