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Quantification of Grain Boundary Segregation Monolayers by X-ray Spectroscopy in a Scanning Electron Microscope

Published online by Cambridge University Press:  08 April 2017

P Nowakowski ,
F Christien ,
M Allart ,
Y Borjon-Piron ,
R Le Gall ,
J Ménard  and
H Mantz
P Nowakowski
Affiliation:
University of Nantes
F Christien
Affiliation:
University of Nantes
M Allart
Affiliation:
University of Nantes
Y Borjon-Piron
Affiliation:
University of Nantes
R Le Gall
Affiliation:
University of Nantes
J Ménard
Affiliation:
Carl Zeiss NTS sas
H Mantz
Affiliation:
Carl Zeiss NTS GmbH

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 602 - 603
Copyright
Copyright © Microscopy Society of America 2011