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An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer

Published online by Cambridge University Press:  08 April 2017

M Terauchi ,
H Takahashi ,
N Handa ,
T Murano ,
M Koike ,
T Kawachi ,
T Imazono ,
N Hasagawa ,
M Koeda  and
T Nagano
...Show all authors
M Terauchi
Affiliation:
IMRAM, Tohoku Univ
H Takahashi
Affiliation:
JEOL
N Handa
Affiliation:
JEOL
T Murano
Affiliation:
JEOL
M Koike
Affiliation:
Japan Atomic Energy Agency
T Kawachi
Affiliation:
Japan Atomic Energy Agency
T Imazono
Affiliation:
Japan Atomic Energy Agency
N Hasagawa
Affiliation:
Japan Atomic Energy Agency
M Koeda
Affiliation:
SHIUMADZU
T Nagano
Affiliation:
SHIUMADZU
H Sasai
Affiliation:
SHIUMADZU
Y Oue
Affiliation:
SHIUMADZU
Z Yonezawa
Affiliation:
SHIUMADZU
S Kuramoto
Affiliation:
SHIUMADZU

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 604 - 605
Copyright
Copyright © Microscopy Society of America 2011