Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

C Schwandt

doi:10.1017/S1431927611003916

Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

Published online by Cambridge University Press: 08 April 2017

C Schwandt

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C Schwandt*: Affiliation:
McCrone Associates

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 608 - 609

DOI: https://doi.org/10.1017/S1431927611003916 [Opens in a new window]

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Sample Rotation: A Mechanical Method to Compensate for Irregular Sample Geometry during Electron Probe Microanalysis of Particles

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