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Advanced FIB Sample Preparation for High Performance TEM Analysis

Published online by Cambridge University Press:  08 April 2017

F Altmann ,
R Salzer ,
M Simon ,
S Huebner ,
C Grosse  and
A Graff
F Altmann
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany
R Salzer
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany
M Simon
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany
S Huebner
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany
C Grosse
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany
A Graff
Affiliation:
Fraunhofer Institut for Mechanics of Materials, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 626 - 627
Copyright
Copyright © Microscopy Society of America 2011