Symposium CC/FF – Defects and Materials Issues in Semiconductors―Relationship to Optoelectronic Properties and Device Reliability
Articles
Relevance of Threading Dislocations for the Thermal Oxidation of GaN (0001)
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- 01 June 2015, mrss15-2133138
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Characterization of Extended Defects Observed in Cadmium Zinc Telluride (CZT) Crystal
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- 28 May 2015, mrss15-2134263
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Evolution of Structural and Optical Properties on PIN and NIP pm-Si:H Devices During 400 Hrs of Light-Soaking
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- 16 June 2015, mrss15-2138457
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Reliability Detection of Process-Induced Metallization Defects in GaAs Devices
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- 18 May 2015, mrss15-2132530
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Large Persistent Photoconductivity in Strontium Titanate at Room Temperature
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- 28 May 2015, mrss15-2090706
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Selectively Nucleated Lateral Crystallization for a Large Single-Grained Pb(Zr,Ti)O3 on Polycrystalline-Silicon Thin-Film Transistors for System-On-Glass Applications
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- 16 June 2015, mrss15-2134971
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Reliability and Degradation Mechanisms in High Power Broad-Area InGaAs-AlGaAs Strained Quantum Well Lasers
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- 28 May 2015, mrss15-2130709
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Ordering of InGaAs Quantum Dots Grown by Molecular Beam Epitaxy under As2 gas flux
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- 28 May 2015, mrss15-2134709
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White beam X-ray Diffraction Topography (WBXDT) Studies of Bridgman Grown CdZnTe Crystals
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- 22 May 2015, mrss15-2134972
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Electrical Characteristics of RF Sputtered ZnO/HfO2 Interfaces in Transparent Thin Film Transistors
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- 24 June 2015, mrss15-2137545
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Impact of low dose gamma irradiation on electronic carrier transport in AlGaN/GaN High Electron Mobility Transistors
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- 22 May 2015, mrss15-2137760
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Mechanical and Optical Properties Characterization of C-Plane (0001) and M-Plane (10−10) GaN by Nanoindentation and Luminescence
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- 11 June 2015, mrss15-2127895
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Physical Mechanisms Affecting the Reliability of GaN-based High Electron Mobility Transistors
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- 18 May 2015, mrss15-2147627
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Space Environments and Effects on CIGS Solar Cells and Modules
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- 14 May 2015, mrss15-2148479
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Modeling of CZT Response to Gamma Photons Using MCNP and Garfield
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- 19 June 2015, mrss15-2137042
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Study of Photoluminescence Properties of CuxO Thin Films Prepared by Reactive Radio Frequency Magnetron Sputtering
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- 11 June 2015, mrss15-2135334
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Reliability Study of Organic Light-emitting Diodes by Continuous-wave and Pulsed Current Stressing
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- 16 June 2015, mrss15-2128645
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The Influence of Thermal Treatment on Monocrystalline CZT and Tellurium Inclusions
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- 12 May 2015, mrss15-2136240
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Effects of Electrical Stress and High-Energy Electron Irradiation on the InGaP/GaAs Heterojunction Phototransistor
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- 11 May 2015, mrss15-2125479
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Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs
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- 12 May 2015, mrss15-2102646
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