23 results
Evaluation of sugarcane genotypes with respect to sucrose yield across three crop cycles using GGE biplot analysis
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- Experimental Agriculture / Volume 57 / Issue 3 / June 2021
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- 04 August 2021, pp. 203-215
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An Observation and Hypothesis for Gate Leakage Mechanism in FinFET Transistor Semiconductor Device from Dies near Wafer Extreme Edge
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2306-2307
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- August 2021
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A Best Known Method to Effectively Differentiate Elements with XEDS Peaks Overlapping for High-Volume Manufacturing of Semiconductor Device at Wafer Foundries
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3154-3155
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- August 2021
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Recovering authentic global position system L1 signals under spoofing using dual receiver direct positioning
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- The Journal of Navigation / Volume 74 / Issue 4 / July 2021
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- 23 March 2021, pp. 782-800
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- July 2021
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Challenges in Characterizations of MTJ Thin Film Stack for Spin-transfer Torque MRAM Device by Analytical TEM in Wafer-foundries
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2820-2821
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- August 2020
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An Approach to Extend Electron Holography into Characterization on Dopant Profiles for FinFET of Nanometer Semiconductor Device in Wafer-foundries
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1412-1413
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- August 2020
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Development of Ultra-thin TEM Lamella Preparation Technique and Its Application in Failure Analysis
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1400-1402
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- August 2020
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A Case-Study of Bubble Formation Mechanism by Analytical TEM during Evaluation of an Incoming Spin-On-Hardmask at Wafer-Foundries
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1784-1785
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- August 2019
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A BKM to Measure BEOL Liner Thickness from XEDS Mapping with Accuracy Within 1%
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 772-773
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- August 2019
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An Evaluation of Beam-Damage Zone in Si Wafer Machined by Gatan MicroPREPTM Laser-Ablation
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1146-1147
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- August 2018
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Quantification of Composition of Epitaxial Si/SiGe by EELS
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 472-473
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- August 2018
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Effectively Characterize Planar-view FinFET Semiconductor Device Etch Uniformity by Introducing Diffraction Contrast in STEM Imaging
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 390-391
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- August 2018
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Validation of Minimum Electron Beam Dosage on Characterization of Carbon-Depletion in ULK Dielectric Materials by EELS Quantifications
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1998-1999
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- August 2018
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Advances in Elemental Electron Tomography for the State-of-the-art Semiconductor Devices and Circuits Characterization and Failure Analysis
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1456-1457
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- July 2017
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A Novel Strategy to Effectively Characterize FinFET Device by Multidirectional Comprehensive Analytical TEM in Semiconductor Wafer-foundries
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 336-337
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- July 2017
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An Application of High-Resolution Dual-Lens Dark-Field Electron Holography in Strain Analysis for Nanometer Semiconductor Device in Wafer-foundries
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1490-1491
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- July 2017
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Application of STEM EELS Quantification Relative Compositional Ratio Mapping to Characterize SiCOH - Ultra Low-k Dielectric Materials in Si-based Devices
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1532-1533
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- July 2016
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Minimize Electron Beam Damage during Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 334-335
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- July 2016
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Application of EFTEM and XEDS Elemental Mapping to Characterization of Nanometer Devices in Semiconductor Wafer-Foundries
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 279-280
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- August 2015
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Characterization of Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2075-2076
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- August 2015
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