Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy

A Precise Description of Inorganic Nanoparticles in HRTEM Micrographs

Unambiguous Detections of The Plane Symmetries That Noisy Experimental Images from Naturally Formed 2D Periodic Arrays of Physical Objects Most Likely Possess

Advances in Mapping Periodic Structural Modulations of Atomic Lattices

Dictionary-based Filling of the Missing Wedge in Electron Tomography

An “Extra Dimension” in Electron Tomography: Automatic Parameter Determination for Next-generation Reconstruction Methods

Practical Implementation of Compressive Sensing for High Resolution STEM

Compressive STEM-EELS

Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

Landyne - a Software Suite for Electron Diffraction Simulation and Analysis

MIPAR™: 2D and 3D Image Analysis Software Designed for Materials Scientists, by Materials Scientists

Silver Nanowire Diameter and Yield Characterization by High-Throughput SEM and Image Analysis

Image Processing and Analysis for Characterization of Patterns in Polystyrene Foam.

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

Multi-Beam Scanning Electron Microscope Design

Selective Detection of Backscattered Electrons in the Compound Lens Equipped UHR SEM

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Miniature Electron Beam Columns: From the Lab to the Field

Imaging a 1 mm3Volume of Rat Cortex Using a MultiBeam SEM

Multi-beam Electron Microscopy: Principles and Applications

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract