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Practical Implementation of Compressive Sensing for High Resolution STEM

Published online by Cambridge University Press:  25 July 2016

Dorothea Mucke-Herzberg ,
Patricia Abellan ,
Michael C. Sarahan ,
Iain S. Godfrey ,
Zineb Saghi ,
Rowan K. Leary ,
Andrew Stevens ,
Jackie Ma ,
Gitta Kutyniok  and
Feridoon Azough
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Dorothea Mucke-Herzberg
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K.
Patricia Abellan
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K.
Michael C. Sarahan
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K.
Iain S. Godfrey
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K.
Zineb Saghi
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, U.K.
Rowan K. Leary
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, U.K.
Andrew Stevens
Affiliation:
Dept. of Elec. and Comp. Engineering, Duke University, Durham, USA Pacific Northwest National Laboratory, Richland, USA
Jackie Ma
Affiliation:
Technische Universität Berlin, Berlin, Germany
Gitta Kutyniok
Affiliation:
Technische Universität Berlin, Berlin, Germany
Feridoon Azough
Affiliation:
School of Materials, Materials Science Centre, University of Manchester, Manchester M13 9PL, U.K.
Robert Freer
Affiliation:
School of Materials, Materials Science Centre, University of Manchester, Manchester M13 9PL, U.K.
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, U.K.
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, Richland, USA
Quentin M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, U.K.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 558 - 559
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Buban, J.P., et al., J. Electron. Microsc 59 (2010) 103–112.Google Scholar
[2] Binev, P., et al, Compressed Sensing and Electron Microscopy, in Modeling Nanoscale Imaging in Electron Microscopy, T. Vogt et al., Eds., (Springer (2012).Google Scholar
[3] Saghi, Z., et al., Nano Letters 11 (2011) 4666.Google Scholar
[4] Stevens, A., et al., Microscopy 63 (2014) 41–51.CrossRefGoogle Scholar
[5] Mücke-Herzberg, D., et al, submitted.Google Scholar
[6] Ma., J., et al, submitted Simultaneous EELS SI and HAADF (18%).Google Scholar
[7] SuperSTEM is the UK EPSRC National Facility for Aberration-Corrected STEM, supported by the Engineering and Physical Science Research Council. PNNL, a multiprogram national laboratory, is operated by Battelle for the U.S. Department of Energy under Contract No. DE-AC05-76RLO1830.Google Scholar