Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-28T10:53:40.063Z Has data issue: false hasContentIssue false
  • English
  • Français

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Published online by Cambridge University Press:  25 July 2016

Jaroslav Jiruse ,
Miloslav Havelka  and
Jan Polster
Jaroslav Jiruse
Affiliation:
TESCAN Brno, Brno, Czech Republic
Miloslav Havelka
Affiliation:
TESCAN Brno, Brno, Czech Republic
Jan Polster
Affiliation:
TESCAN Brno, Brno, Czech Republic

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 578 - 579
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Jiruse, J, et al, Microsc. Microanal 19(Suppl 2 (2013). p 1302.CrossRefGoogle Scholar
[2] Shao, Z & Lin, PSD Rev. Sci. Instrum 60(11 (1989). p 3434.CrossRefGoogle Scholar
[3] Jiršse, J, et al, Ultramicroscopy 146(27 (2014).Google Scholar
[4] Stolcova, L, et al, Imaging & Microscopy, (Issue 4, (2015), p 34.Google Scholar