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An “Extra Dimension” in Electron Tomography: Automatic Parameter Determination for Next-generation Reconstruction Methods

Published online by Cambridge University Press:  25 July 2016

Yi Jiang ,
Nina Andrejevic ,
Elliot Padgett  and
David A. Muller
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853
Nina Andrejevic
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 556 - 557
Copyright
© Microscopy Society of America 2016 

References

[1] Saghi, Z., etal, Nano letters 11 (2011). p. 4666–4673.Google Scholar
[2] Sidky, E., etal, Physics in medicine and biology 53 (2008). p. 4777–4807.Google Scholar
[3] Bian, J., et al, Physics in medicine and biology 59 (2014). p. 2659–2685.Google Scholar
[4] Hovden, R., et al, Microscopy and Microanalysis 21 (2015). p. 2407–2408.CrossRefGoogle Scholar
[5] Y. Jiang acknowledges funding from DOE grant DE-SC0005827.Google Scholar