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Volume 11 - October 2005

Contents

Page 28 of 61

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences

Research Article

  • Feasibility of Focused Ion Beam Milling for Preparation of TEM Specimens of Biological Material Embedded in Vitreous Ice

  • M Marko, C-E Hsieh, W J MoberlyChan, C A Mannella, J Frank
  • Published online by Cambridge University Press:
    01 August 2005, pp. 802-803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Some Charge Control Criteria for Focused Ion Beam Milling of Insulators and Biological Specimens using a Quanta 3D DualBeam ESEM

  • D J Stokes, F Morrissey, W R Knowles, A M Donald
  • Published online by Cambridge University Press:
    01 August 2005, pp. 804-805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Focused Ion Beam Sculpting Curved Shapes

  • D Adams, M Vasile
  • Published online by Cambridge University Press:
    01 August 2005, pp. 806-807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Sculpting Needle-Shaped Atom Probe Specimens with a Dual Beam FIB

  • M K Miller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 808-809
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nano Factory Achieved by Focused Ion Beam

  • T Fujii, T Kaito
  • Published online by Cambridge University Press:
    01 August 2005, pp. 810-811
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • GaN(x)As(1-x) Quantum Structures Fabricated by FIB Patterning

  • K Alberi, A M Minor, S J Chung, D E Mars, K M Yu, W Walukiewicz, O D Dubon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 812-813
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Selective Electron Beam Erosion and Deposition of Materials

  • D C Joy, P D Rack
  • Published online by Cambridge University Press:
    01 August 2005, pp. 816-817
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In-situ Electrical Characterization of Nano-Interconnect Structure in FIB

  • D D Cha, Y Ai, J Huang, T Zheng, B Gnade. E, M J Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 818-819
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Methods for Structuring and Prototyping on a Nanoscale Using a DualBeam

  • F Morrissey, S Reyntjens, K Nakahara, C Jiao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 820-821
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Maskless Fabrication of Highly-Ordered Periodic Nanopillars using FIB and Bitmap Control

  • W Zhou, H Qian, L Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 822-823
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Feedback Control of Gas Chemistry Reactions in the FIB

  • L Zaykova-Feldman, T M Moore
  • Published online by Cambridge University Press:
    01 August 2005, pp. 824-825
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Folded Cavity Surface Emitting Lasers Fabricated by Focused Ion Beam Etching

  • G DeRose, A Scherer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 826-827
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon

  • L A Giannuzzi, R Geurts, J Ringnalda
  • Published online by Cambridge University Press:
    01 August 2005, pp. 828-829
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument

  • E L Principe, P Gnauck, P Hoffrogge
  • Published online by Cambridge University Press:
    01 August 2005, pp. 830-831
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • FIB Microscopy of Martian Meteorite ALH84001 Carbonate Disks

  • M P Bernas, S J Clemett, K L Thomas-Keprta, D S McKay, E K Gibson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 832-833
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Shadow FIBing- Using Geometry to Prepare TEM Samples

  • S Welz, N Browning, A M Minor
  • Published online by Cambridge University Press:
    01 August 2005, pp. 834-835
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Three-Dimensional Reconstruction of Alpha Laths in Alpha/beta Titanium Alloys by Serial Sectioning with a FEI NOVA

  • R E A Williams, M Uchic, D Dimiduk, H L Fraser
  • Published online by Cambridge University Press:
    01 August 2005, pp. 836-837
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mechanical Conversion for High-Throughput TEM Sample Preparation

  • L Zaykova-Feldman, T M Moore
  • Published online by Cambridge University Press:
    01 August 2005, pp. 838-839
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cross-Sectioning of Plan-View Samples and Artifacts of TEM Sample Preparation

  • M V Sidorov
  • Published online by Cambridge University Press:
    01 August 2005, pp. 842-843
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 28 of 61