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Volume 11 - October 2005

Contents

Page 27 of 61

Scanning Electron Microscopy (SEM)

Research Article

  • Introduction to the Capabilities and Applications of the World's Largest Chamber Scanning Electron Microscope

  • S Dekanich, J Frafjord, D Carpenter, B Bolinger
  • Published online by Cambridge University Press:
    01 August 2005, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Beam-Induced Sample Contamination in the SEM

  • A Vladar, M Postek
  • Published online by Cambridge University Press:
    01 August 2005, pp. 764-765
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nano-tip Electron Gun for the Scanning Electron Microscope

  • A Vladar, Z Radi, M Postek, D Joy
  • Published online by Cambridge University Press:
    01 August 2005, pp. 766-767
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Absolute Calibration of Auger Spectrometer for Measuring SE and BSE Yield

  • Y Lin, D Joy, H Meyer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 768-769
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Comparison of the Appearance of Various High Resolution Sputter Coatings

  • T Stephens
  • Published online by Cambridge University Press:
    01 August 2005, pp. 770-771
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative Film Thickness Measurement Using Scintillator/Photomultiplier Backscattered Electron Detectors. Possible or Not?

  • P Hovington, M Lagacé, P Noël
  • Published online by Cambridge University Press:
    01 August 2005, pp. 772-773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Crystallography

Research Article

  • Residual Strain Measurement of SOI Wafer Using Convergent Beam Electron Diffraction

  • K Kuramochi, T Yamazaki, T Isaka, K Watanabe, I Hashimoto
  • Published online by Cambridge University Press:
    01 August 2005, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Powder Diffraction File (PDF): A Relational Database For Electron Diffraction

  • J Faber, T Fawcett, R Goehner
  • Published online by Cambridge University Press:
    01 August 2005, pp. 778-779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Precession for Routine Crystallography

  • C S Own, L D Marks
  • Published online by Cambridge University Press:
    01 August 2005, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles

  • R V Petrova, R R Vanfleet, D R Richardson, B Yao, K R Coffey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Confocal Microscopy

Research Article

  • Confocal Holography: Improved Resolution Through Object Scanning

  • R A McLeod, P Jacquemin, S Lai, R A Herring
  • Published online by Cambridge University Press:
    01 August 2005, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Practical Advances in Raman Microscopy

  • T J Tague Jr, J Zhao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In Vivo Confocal Raman Microspectroscopy of the Skin: Effect of Skin Care Products on Molecular Concentration Depth-Profiles

  • S L Zhang, P J Caspers, G J Puppels
  • Published online by Cambridge University Press:
    01 August 2005, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nanoindentation-Induced Phase Transformations in Ge Studied by Electron Microscopy and Raman Spectroscopy

  • S Wen, J-I Jang, M J Lance, J Bentley, G M Pharr
  • Published online by Cambridge University Press:
    01 August 2005, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Z Metal Carbonyls for Imaging and Microspectroscopy

  • V N Joshi, D Ramamurthy, R D Powell, F R Furuya, J F Hainfeld
  • Published online by Cambridge University Press:
    01 August 2005, pp. 794-795
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Advances in Infrared Microprobe Instrumentation: Integration of Image Analysis and Molecular Spectroscopy

  • J A Reffner, J A Seelenbinder, C H Tobler
  • Published online by Cambridge University Press:
    01 August 2005, pp. 796-797
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences

Research Article

  • The Application of Focused Ion Beam (FIB) on Biological Samples

  • H L Hing, M A Kaswandi, S Normalawati, A Z Sahalan, Y Muranaka
  • Published online by Cambridge University Press:
    01 August 2005, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Investigation of the Interface Between Biological Cell Tissue and Hard Substrate Materials using CrossBeam Technology

  • P Gnauck, C Burkhardt, H Wolburg, W Nisch
  • Published online by Cambridge University Press:
    01 August 2005, pp. 800-801
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 27 of 61