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Absolute Calibration of Auger Spectrometer for Measuring SE and BSE Yield

Published online by Cambridge University Press:  01 August 2005

Y Lin ,
D Joy  and
H Meyer
Y Lin
Affiliation:
University of Tennessee
D Joy
Affiliation:
Oak Ridge National Laboratory, Tennessee
H Meyer
Affiliation:
Oak Ridge National Laboratory, Tennessee

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 768 - 769
Copyright
© 2005 Microscopy Society of America